Analysis of Scanning Acoustic Microscopy Images of Ic Chips
نویسندگان
چکیده
The detection, isolation, and characterization of flaws in components represent a critical need in manufacturing and quality control. Nondestructive testing (NDT) provides an effective way of inspecting materials for ensuring the quality and integrity of products and systems. Consequently, nondestructive inspection finds extensive application in several industries such as steel, nuclear and electronic industries for the evaluation of complex test objects with minimal interruption of routine operations[ 1].
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